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junction depth measurement [1 record]

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Record 1 2001-05-15

English

Subject field(s)
  • Semiconductors (Electronics)
  • Printed Circuits and Microelectronics
CONT

Junction depth measurement uses a testing instrument designed to measure the depth of a semiconductor device after it has been doped. The junction is the region of transition between two different semiconductor regions of a semiconductor device, such as a p-n junction, or between a metal and a semiconductor. There are four types of junctions; alloy, diffused, electrochemical, and grown.

French

Domaine(s)
  • Semi-conducteurs (Électronique)
  • Circuits imprimés et micro-électronique

Spanish

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